New Surface-Image studiables contain the following layers: height information layer, RGB colour information layer, and/or intensity information layer.

This type of data is specifically dedicated to colour confocal microscopes and focus variation systems.

The new Statistics Panel (displayed in the navigation panel on the right hand of the screen) makes it easy to create, modify and organize statistical populations. Both static populations (located at a fixed place with a fixed number of elements) and dynamic populations (dynamically refreshed when a new element is measured) are now supported. New capability parameters (Cpk) are available.

The Advanced Contour module provides powerful dimensional analysis of component geometry. Features include intelligent nominal form definition, magnified form deviation graphics, form error parameters, support for large positional tolerances, Gothic Arch analysis, and automatic generation of the table of results.
  More information on the Advanced Contour module (PDF)

Each studiable in a 4D series of 3D surfaces can store different information on the T-axis, for example time, temperature, pressure and magnetic field.

The Welcome dialog has been redesigned and video sequences are now available to speed up familiarity with the main functions and the working environment. Video presentations come with English audio commentary and sub-titles.

A 64-bit version of the software is now available on Windows Vista 64 and Windows 7 64, making it possible to process large data sets more quickly (memory over 3 GB is used if available).
Note 1: Windows XP 64 is not supported.
Note 2: in the 64-bit version, scripting functions (plug-ins...) cannot be used.

Enhancements have been made that accelerate time-consuming operations (see Table), exploit multi-core processors and provide increased interactivity.

*All tests performed on a dual-core computer. Time gain may vary depending on the configuration.

The origin of X-Y axes can now be set at the bottom-left corner of the image (direct axis system), or at the top-left corner (as previously).

ISO standard references can now be localized using the national standard reference (NF, DIN, BS, JIS), when a direct equivalence exists.

Mountains® platform is now compatible with Windows 7 (32-bit and 64-bit editions)

• Full metrological traceability, combined with the ability to add, delete and modify the steps in an analysis in real time, via the new interactive analysis workflow.
• Simplified management of measured data using the new File Explorer.
• Faster navigation inside long analysis documents using the Page Viewer.
• Speed up the analysis process by saving frequently used analysis sequences as Minidocs® for inclusion in any analysis document.
• Straightforward selection of applicable 3D and 2D parameters by ISO standard or family, and optional configuration of individual parameters.

• Enhanced 3D imaging with the new interactive color-coded z-axis palette (including a histogram showing the distribution of data points on the z-axis) and the ability to apply materials (matt, shiny, ...) to a surface.
• Improved illustration capabilities (arrows, frames, etc.)

• Define any flight path over a surface (or a changing series of surfaces), view the simulated flight as a movie, incorporate it into a presentation for maximum impact.

• All of the 3D parameters defined in the forthcoming ISO 25178 standard on areal surface texture.
• Analysis of 3D motifs based on watershed segmentation, according to ISO 25178 feature parameters.

• Visualize and analyze RGB Z measurements made by microscopes.
• Overlay the color image on a 3D topographic view.

• Generate statistics on analysis results relating to one or more populations of measurement data.
• Display Trend plot, Scatter plot, Box plot, Distributions, Statistic parameters.
• Mean, Standard deviation, min, max, quartiles

• Visualize a series of surfaces changing with respect to a fourth physical dimension (time, temperature, magnetic field, etc.), make a movie of surface change.
• Analyze surface evolution: parameter tables, scatter plots, box charts, histograms.
• Locate zones showing the greatest change using the Karhunen-Loève Transform.

• Automatically combine overlapping measurements made on a grid.
• Calculates best overlaping zones between each surface.
• Overcome field of view limitations of matrix microscopes and SPM's.

• Estimate tip geometry (e.g., using the blind reconstruction method) or use a saved tip geometry.
• Correct for the effect of the tip when a surface is measured.
• Generate the deconvoluted surface and the certainty map.

• Display deflection or force versus distance or separation.
• Analyze a series of force curves.