Analysis of a full range of measurement data types

2D profiles

2D analysis of profiles, z = f(x), is still very common in industry. However, it is only appropriate when the surface under study is anisotropic and presents the same characteristics regardless of measurement direction.

Series of 2D profiles

Surfaces that are moderately anisotropic, for example fine grained surfaces, can be analyzed by measuring multiple profiles of the same length in different directions and taking the average of the parameters that are obtained. Series of profiles introduce statistical results for better stability of results.

3D surfaces

3D topographic measurements, z = f(x, y), are essential for anisotropic surfaces (such as structured surfaces) and for understanding functional characteristics.

Multi-layer surfaces

Some types of instrument generate multiple layers of data, for example SPM's (topography, phase, deflection, etc.) and CLSM's (topography, intensity, color image). Mountains® can manipulate all layers simultaneously and also analyze individual layers or series of individual layers independently.

4D series of surfaces

4D measurements, z = f(x, y, t), are series of 3D surfaces. 4D analysis is an innovation, making it possible to analyze surface evolution with respect to any fourth dimension such as time, temperature, pressure, etc.

Compatible with contact and non-contact

Mountains® features are capable of handling non-measured points generated by optical instruments 100% seamlessly. The ability to manage non-measured areas is also exploited in the local analysis of sub-surfaces (regions of interest), which can be created by the introduction of non-measured points.

2D Profile measured by a stylus profilometer.

Multilayer file: phase, amplitude, topography (left). Phase layer overlaid on topography (right)

4D analysis in 15 frames showing surface evolution with respect to time.

3D surface showing a bump surrounded by a non-measured area.

Multilayer file: color image, topography (left),
RGB image overlaid on topography (right).