MountainsMap SPM 6.2 applications:

• The challenge of characterizing nanowire morphology (IEMN).
• Quantum dots: pulsed laser post growth laser patterning (ICMAB-CSIC).

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• Correlative surface metrology.
• 2nd generation lead analysis (automotive industry)
• Multi-scale wavelets analysis
• Extended interoperability (MATLAB™ compatibility and universal ASCII data export).

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• New foundations for modern surface texture analysis: ISO 25178 & ISO/TS 16610.
• ISO 25178 parameters.
• New parameter naming conventions and authorized filters.
• Future work at ISO TC213.
• ISO 25178 and ISO/TS 16610 document status.

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• Mountains 6 for SPM's.
• ICMAB-CSIC: new precursor families for molecular electronics.
• LNE (French National Metrology Institute): dimensional nanometrology.
• Force curve analysis.
• 4D movie of surface evolution.
• Atomic step heights.

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• Mountains 6 - a universal solution for surface imaging and analysis.
• Advanced characterization of surface texture with local features, by François Blateyron.
• Mountains 6 - Makalu 2010 expedition reaches the summit.
• Digital Surf in Tokyo provides local support for the Asia-Pacific region.

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In Japanese language, for the Micromachines/MEMS exhibition.

• What's new in Mountains Technology 6?
• Digital Surf provides local support in the Asia-Pacific region.
• Article on the advanced characterization of surface texture with local parameters, by François Blateyron.
• The right parameters wherever you are.
• Mountains 6 - Makalu 2010 expedition at the summit

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• Instrument-oriented Mountains Technology version6
• Which MountainsMap® are you?
• What’s new in Mountains Technology 6?
• The right parameters wherever you are
• Going to the summit Mountains 6 – Makalu 2010

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• Theme: Visualize - Analyze - Report.
• Focus on using Mountains to prepare high quality images prior to characterization and analysis.
• Case study: measurement of a step height on exfoliated graphene sheets (courtesy French National Metrology Institute).

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• Release of Mountains® version 5.1.
• Scale-sensitive fractal analysis by Prof. Chris Brown.
• Mountains scale-sensitive fractal analysis plug-in
• Surface characterization for competitive manufacturing by Bengt-Göran Rosèn

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Special issue on Advanced Contour

• New optional module compatible with almost all Mountains products.
• Analyze dimensions, angles, radii, diameters, tolerances; fit to DXF.

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Special issue on Nanometrology

• LNE, France: National Metrology Institute, working on several research programmes on nanometrology.
• ICMAB-CSIC, Barcelona: research on magnetic material for spintronic.

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• LTI, Luxemburg: Henri Tudor Public Research Center. Research on non-toxic hexavalent chromium, using 4D module.
• New Stitching module in MountainsMap.

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• 4D surface analysis: study the dynamics of the surface in function of time, temperature, pressure...
• Sub-surface extraction and analysis.

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• ICMAB-CSIC: Research on nanomaterials, using Mountains-SPM®.
• Self-assembling nanostructures: nanowalls and nanodots.

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• MountainsMap® version 5: .
• Focus on 3D motifs parameters and volume parameters.

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Discover the key features in Mountains®.

Download 6 page brochure (pdf, 1.9 MB, English)

Download 6 page brochure (pdf, 1.7 MB, Japanese)

Download 6 page brochure (pdf, 2.0 MB, Chinese)

Article written by François Blateyron and Antony Caulcutt on 3D Imaging and Analysis using surface metrology software, published in Imaging & Microscopy, March 2006.

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Article written by François Blateyron on "3D Parameters and New Filtration Techniques", from the proceedings of the (JSPE) Japanese Society of Production Engineers, March 2006.

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