In Japanese language, for the Micromachines/MEMS exhibition.

• What's new in Mountains Technology 6?
• Digital Surf provides local support in the Asia-Pacific region.
• Article on the advanced characterization of surface texture with local parameters, by François Blateyron.
• The right parameters wherever you are.
• Mountains 6 - Makalu 2010 expedition at the summit

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• Instrument-oriented Mountains Technology version6
• Which MountainsMap® are you?
• What’s new in Mountains Technology 6?
• The right parameters wherever you are
• Going to the summit Mountains 6 – Makalu 2010

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• Theme: Visualize - Analyze - Report.
• Focus on using Mountains to prepare high quality images prior to characterization and analysis.
• Case study: measurement of a step height on exfoliated graphene sheets (courtesy French National Metrology Institute).

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• Release of Mountains® version 5.1.
• Scale-sensitive fractal analysis by Prof. Chris Brown.
• Mountains scale-sensitive fractal analysis plug-in
• Surface characterization for competitive manufacturing by Bengt-Göran Rosèn

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Special issue on Advanced Contour

• New optional module compatible with almost all Mountains products.
• Analyze dimensions, angles, radii, diameters, tolerances; fit to DXF.

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Special issue on Nanometrology

• LNE, France: National Metrology Institute, working on several research programmes on nanometrology.
• ICMAB-CSIC, Barcelona: research on magnetic material for spintronic.

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• LTI, Luxemburg: Henri Tudor Public Research Center. Research on non-toxic hexavalent chromium, using 4D module.
• New Stitching module in MountainsMap.

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• 4D surface analysis: study the dynamics of the surface in function of time, temperature, pressure...
• Sub-surface extraction and analysis.

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• ICMAB-CSIC: Research on nanomaterials, using Mountains-SPM®.
• Self-assembling nanostructures: nanowalls and nanodots.

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• ISO 25178: the new standard for 3D surface texture analysis.

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• MountainsMap® version 5: .
• Focus on 3D motifs parameters and volume parameters.

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4-page color brochure about the Mountains® Technology products and general overview of main features.

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Download this brochure (pdf, 4.5 MB, Japanese)

Article written by François Blateyron and Antony Caulcutt on 3D Imaging and Analysis using surface metrology software, published in Imaging & Microscopy, March 2006.

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Article written by François Blateyron on "3D Parameters and New Filtration Techniques", from the proceedings of the (JSPE) Japanese Society of Production Engineers, March 2006.

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