Optional Modules


The following modules are available for MountainsMap version 7.

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Advanced Analysis Modules


3D Advanced
Surface Texture


 MountainsMap® Premium
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® SEM

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All of the additional studies, parameters and filters you need for advanced 3D surface texture analysis


 Subsurface analysis - extract a geometric subsurface (for example a component layer) from a full surface that has been partitioned using the ISO 25178 segmentation by watersheds algorithm, calculate its flatness instantaneously, analyze it in the same way as a full surface.
 More surface texture and form parameters - ISO 25178 and EUR 15178 (Surfstand) functional volume, spatial and hybrid parameters, ISO 12178 flatness parameters
 Functional volume analysis (wear and lubrication) - display ISO 25178 and Sk functional volume parameters graphically to facilitate studies of wear and lubrication - study peak/grain/particle distribution and density.
 Fractal analysis - analyze the fractal dimension of a surface using the enclosing boxes and morphological envelope methods.
 Surface isotropy, directionality and periodicity - calculate isotropy, periodicity, period and period direction - view dominant surface directions on a compass rose.
 Morphological filtering - apply morphological filters (erosion and dilation operations, opening and closing filters, sequential filters) using a plane or spherical structuring element.
 MATLAB™ compatibility - load or write MATLAB™ scripts and execute them to carry out custom operations including filtering.
 Study circular profiles - extract circular profiles and display the abscissa in degree units.
 Analyze furrows - detect and visualize furrows above or below a threshold height - calculate furrow parameters: max depth, mean depth and mean density.


3D Fourier & Wavelets Analysis


 MountainsMap® Premium
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® SEM
 MountainsMap® Image

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Use advanced FFT-based and wavelets tools to analyze process-surface interactions and texture scales, and to denoise surfaces


 Frequency spectrum - display frequency spectrum plots for 3D surfaces with x and y, wavelength, angle, magnitude and phase - display 2D frequency spectrum plots for 2D profiles with wavelength, magnitude and phase.
 Power spectrum density - display the power spectrum density plot and select the vertical scale and measurement location interactively (3D surfaces and 2D profiles).
 Surface isotropy, directionality and periodicity - calculate isotropy, periodicity, period and period direction - view dominant surface directions on a compass rose.
 Autocorrelation and intercorrelation - study 3D surface and 2D profile autocorrelation and intercorrelation.
 Detect smaller spectral structures - use Hanning windows to eliminate stray spectral lines.
 Denoising - filter noisy profiles and surfaces by editing the FFT plot directly within selected upper and lower bounds.
 Continuous wavelet decomposition - visualize the scales and spatial locations where phenomena occur on 2D profiles - use Coiflet 1-5, Daubechies 1-10, Discrete Meyer, Gauss 1-8, Mexican Hat, Morlet and Symlet 1-8 wavelet.
 Discrete wavelet filtering - decompose a 2D profile or 3D surface into a set of profiles or surfaces at different levels of scale - select the scale levels for inclusion in the roughness profile and hence the waviness profile - use Coiflet, Daubechies, Discrete Meyer, Spline and Symlet wavelet families (wavelet spline filtering is an advanced filtering technique defined in ISO 16610).

Note: in version 6 these features are available as two separate modules (3D Fourier Analysis & 3D Wavelets Analysis)



2D Advanced Surface Texture


 MountainsMap® Premium
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® Form & Vision
 MountainsMap® SEM
 MountainsMap® Profile

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Everything that you need for advanced 2D surface texture analysis


 Advanced 2D filtering techniques - remove form and apply roughness/waviness filters from 2RC to ISO 16610 - apply morphological filters using a straight or round structuring element - filter noisy profiles directly by editing the FFT plot within selected upper and lower bounds.
 MATLAB™ compatibility - load or write MATLAB™ scripts and execute them to carry out custom operations including filtering.
 Correct measurement anomalies - use data correction tools (thresholding, retouching, resampling) to eliminate anomalies and improve resolution prior to analysis.
 Assess surface functionality - study the bearing ratio curve and depth distribution histogram to evaluate surface functionality - subtract profiles to assess wear.
 Use FFT-based tools to analyze process-surface interactions and other surface characteristics - display frequency spectrum and power spectrum density plots - carry out autocorrelation and intercorrelation studies.
 Fractal analysis - analyze the fractal dimension of a profile using the enclosing boxes and morphological envelope methods.
 Overcome measurement limits virtually - join overlapping profiles to overcome physical measurement limits virtually, with automatic calculation of the overlap zone.
 Statistical analysis of series of profiles or multiple profiles extracted from the same surface - load a series profiles measured by 2D profilers or load surfaces measured by 3D profilers and extract one or more profiles for analysis - analyze series of profiles or multiple profiles extracted from the same surface statistically (trend plots, scatter plots, histograms) for process control or to achieve more reliable results.


Application-oriented Modules


Grains & Particles


 MountainsMap® Premium
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® SEM
 MountainsMap® Image

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Analyze grains and texture cells using multiple complementary methods, including motifs analysis


 2D analysis with respect to a horizontal plane - detect grains by binarization on a horizontal plane at a user-selected level with interactive preview - apply morphological operators to merge or separate grains - partition grains into sub-sets with respect to any parameter - generate statistics for all grains, subsets of grains or individual grains - visualize grain topography by overlaying the 3D surface topography on binarized grains using binary masking.
 3D analysis with respect to a height - detect islands above a threshold height with interactive preview - calculate parameters for individual islands including volume - generate statistics on all islands.
 Motifs (texture cell) analysis - detect motifs using advanced ISO 25178 segmentation by watersheds and Wolf pruning algorithms - view hill motifs (bumps), dale motifs (holes) and shapes (on irregular surfaces) - change settings to merge or divide motifs into significant motifs - color motifs or superimpose them on surface topography - fit spheres to motifs (for microlens arrays) - calculate morphological parameters for individual motifs including sphere parameters - generate statistics on all motifs.
 Calculate the new ISO 25178 features parameters (Spd, Spc, S5p, S5v, S10z, Sha, Sda, Shv, Sdv) - apply the new, more accurate Spd (peak density) and Spc (arithmetic mean peak curvature) parameters in tribological studies, for example of plasticity and elasticity.
 Analyze texture direction - display compass rose showing texture direction(s) - calculate surface isotropy.
 Analyze furrows (dermatology) - detect and visualize furrows above or below a threshold height - calculate furrow parameters: max depth, mean depth and mean density.

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Statistics


 MountainsMap® Premium
 MountainsMap® Universal
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® SEM
 MountainsMap® Image
 MountainsMap® Profile

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Automated easy to use statistics for multiple measurement populations


 Automated data preparation - apply a template to analyze each measurement in a population automatically and generate one analysis document per measurement containing all of the parameters for statistical analysis.
 Multiple populations - define multiple populations for statistical analysis by simply selecting the analysis documents corresponding to each measurement population or by specifying the folder where they are located - calculate statistics for one or more populations including dimensions (distances, areas, volumes, step heights, angles) and parameters (e.g. ISO 4287 or ISO 25178 parameters).
 Dynamic and static populations - declare whether a population is static (all measurements are done) or dynamic (measurements are ongoing) - new measurements in a dynamic population are analyzed automatically and statistics are refreshed to take new data into account.
 Control your process - display control charts for an instant picture of whether or not a parameter is out of limits, together with histograms, box plots and scatter plots.
 Evaluate manufacturing system capability - calculate capability parameters (Cp, Cpk, Cpkl, NT and ET) to evaluate the capability of the manufacturing system to repeat itself.
 Data export - export results to quality management systems in Excel-compatible format.


4D Series Analysis


 MountainsMap® Premium
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® SEM
 MountainsMap® Image

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Study surface evolution with respect to time or any other physical dimension


 Load a series of measurements of the same surface and combine them for 4D analysis - load 3D measurements of the same surface made at different times or under different environmental conditions - combine the measurements into a series with 4 dimensions x, y, z and t, where t is time, temperature, pressure, magnetic field or another fourth dimension (linear or non-linear) - add a new measurement to the series or delete an old measurement at any time - ensure point to point matching using automatic and manual shifting tools - apply preprocessing operators simultaneously to every 3D measurement in the series.
 Visualize surface, profile and point evolution - display all of the surfaces in the series in a grid or walk through them one by one - display an animated view of the surfaces as they change with respect to time or another dimension - fly over the series, see the surface changing and record a movie for presentations - extract a profile between points and see how it evolves - extract a transverse profile showing changes in the height of a single point on the surface.
 Generate statistics and highlight areas of preponderant change - generate statistics showing how one or more parameters evolve as the surface changes: parameter tables (including min, max, standard deviation), control charts, scatter plots, histograms - highlight areas of preponderant change using the Karhunen-Loève transform (principal component analysis).


Stitching


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 MountainsMap® Universal
 MountainsMap® Imaging Topography
 MountainsMap® Image
 MountainsMap® SPM
 MountainsMap® SEM
 MountainsMap® Form & Vision

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Increase the field of view and vertical range of your instrument virtually


 Automatically assemble overlapping measurements made on a horizontal grid - stitch together multiple measurements into a single surface ready for analysis - especially useful for confocal and interferometric microscopes with limited field of view.
 Manual patching of overlapping measurements made at different heights - assemble overlapping measurements made at different heights into a single surface ready for analysis - especially useful for profilometers and other instruments with limited vertical range.


Contour


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 MountainsMap® SEM
 MountainsMap® Profile
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® Image

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All the essential tools for geometric dimensioning & tolerancing of profiles


 Calculate dimensions of profiles using interactive tools - calculate dimensions including distances, radii, diameters and angles.
 Define & display pass/fail criteria with tolerances for any dimension
 Save time & increase productivity with automation features - save your contour analysis steps and reapply them on other profiles


Advanced Contour


 MountainsMap® Premium
 MountainsMap® Profile
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography
 MountainsMap® Universal
 MountainsMap® SPM
 MountainsMap® SEM

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Powerful geometric dimensioning & full form deviation analysis


 Use auto-dimensioning tools to analyze the dimensions of profiles measured on component surfaces – lines, arcs, circles and angles between intersecting tangents.
 Compare profiles with CAD data in DXF format or user-defined nominal form
 Automatic generation of table of results with data export - export results in Excel-compatible format for quality management systems.
 Graphical display of form deviations - out-of-tolerance deviations are highlighted visually
 Advanced functions – process profiles with variable dimensions - Gothic Arch analysis etc.


2D Automotive


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 MountainsMap® Profile
 MountainsMap® Scanning Topography
 MountainsMap® Imaging Topography
 MountainsMap® Universal

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Assess functional performance with a full set of 2D parameters developed by the automotive industry


 Comprehensive set of 2D parameters in accordance with international standards
- ISO 13565-2 Rk parameters
- ISO 13565-3 parameters
- ISO 12085 motifs parameters
- ISO 12780 straightness parameters
- ISO 12781 roundness parameters.
- VDA 2007 dominant waviness
 Graphical study of parameters associated with wear and lubrication
- display of the graphical construction of Rk parameters on the Abbott curve
- display of intermediate profiles calculated in the double-Gaussian filter
- display of R&W motifs on the profile.


Lead (Twist) Analysis


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 MountainsMap® Universal
 MountainsMap® Profile
 MountainsMap® Imaging Topography
 MountainsMap® Scanning Topography

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2nd generation lead analysis for the automotive industry


 Generate a lead (twist) analysis report automatically (a Minidoc is applied to the measurement data set) - the report includes: lead parameters relevant to the leak-tighness of crank shaft seals and therefore to oil consumption, measured lead structure, reconstructed lead surface, comparison of lead profile and approximated profile - it is possible to cycle though all lead profile - approximated profile pairs.
 Mercedes-Benz Engineering Standard compliance - the module is under license from Mercedes-Benz and complies with the Mercedes-Benz Engineering Standard (Measurement and Evaluation Method for the Assessment of Lead-Reduced Dynamic Sealing Surfaces, 2009) widely adopted in the automotive industry.


AFM Force Curves


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 MountainsMap® Universal
 MountainsMap® SPM

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Force curve analysis with automatic detection of adhesion points, WLC models and statistics


 Automated setup - a Minidoc (applied automatically when a force curve is loaded) denoises force curves, normalizes force curve baselines and calibrates cantilever sensitivity - denoising (median or Gaussian filter) and baseline normalization can be fine tuned interactively, together with cantilever and spring constant settings
 Force curve visualization - display attract and/or retract curves - select axis units: X distance, separation or time; Y deflection (in V or nm) or force in nN.
 Automatic event detection and parameter calculation - detect and display adhesion events automatically (with optional fine tuning of non-zero attraction point and retraction point cursors) - calculate event parameters: distance, force, slope, distance difference, force difference.
 Wormlike chain (WLC) models - generate a wormlike chain (WLC) model for protein unfolding and calculate the persistence length, contour length and estimated spring constant at each event.
 Analysis of series of force curves - grid view of all force curves in a series - scroll through a series of force curves and display parameters for each curve in the series - generate statistics (control charts, scatter plots, histograms) on any parameter.


Instrument-oriented Modules


Colocalization


 MountainsMap® Premium
 MountainsMap® SEM
 MountainsMap® Universal
 MountainsMap® Imaging Topography
 MountainsMap® SPM

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Colocalize data from different instrument types and carry out correlative studies


 Combine surface data from different instrument types including 3D optical profilers & AFM, STM, SEM, fluorescence, Raman, IR & other microscopes.
 Colocalize images from different instruments /detectors.
 Overlay images on 3D surface topography - view 3D overlays at any zoom level and angle.
 Convert color and grayscale images into 3D colored pseudo-surfaces (z axis in intensity units).


SPM Extension


 MountainsMap® Premium
 MountainsMap® SPM
 MountainsMap® Imaging Topography
 MountainsMap® SEM

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Extend your product with SPM dedicated features


 SPM file formats - load almost all file formats generated by SPM controllers and software packages.
 Multi-channel - Add support of multi-channel images and associated studies and operators.
 Image correction - Correct images from acquisition errors (line correction, tip deconvolution).


SEM Extension


 MountainsMap® SEM
 MountainsMap® Premium
 MountainsMap® Universal

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Enhance and analyze SEM images and go 3D with your SEM!


 High quality imaging - improve image quality with image enhancement tools and denoising filters.
 SEM image coloring - convert SEM images into colored 3D intensity maps.
 Distance and angle measurement.
 3D reconstruction - reconstruct 3D surfaces from stereo image pairs, anaglyphs and quads.
 Anaglyphs - generate anaglyphs from 3D topography for viewing with stereoscopic glasses.
 Profile (cross-section) extraction - from reconstructed 3D surfaces.
 Contour dimensional analysis - of horizontal contours extracted from the XY plane and vertical contours (XZ profiles).
 Subsurface analysis - extract and level planes on surfaces of microelectronic, micromechanical and other components.
 Colocalization for correlative studies - colocalize different SEM images (for example a backscattered electron image with a secondary electron image) - colocalize SEM images with surface topography obtained by other microscopes or profilometers* - overlay images on 3D surface topography*. (* Availability of these functions depends upon what instrument file formats are supported by your software.)
 MATLAB™ compatibility - load or write MATLABT scripts and execute them to carry out custom operations including filtering.