MountainsMap® Universal

Universal all-round modular surface imaging, analysis and metrology software solution compatible with all types of surface imaging and measuring instrument

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Product Information Sheet
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Why choose MountainsMap® Universal software?


The best incremental surface analysis software for multiple instrument types

MountainsMap® Universal software is compatible with the same broad range of instruments as the top of the line MountainsMap® Premium solution. While MountainsMap® Premium is an all-in solution, MountainsMap® Universal is an incremental solution. It contains a full set of basic analytical studies. You can add numerous optional modules that provide the greater surface analysis power required for advanced or specialized applications.

The latest standards & methods

Whatever MountainsMap® Universal configuration you choose - from a basic system to an advanced system with add-on modules - building analysis reports in accordance with the latest standards is easy. You create visual reports frame by frame, page by page, working in a highly intuitive desktop publishing environment. A hierarchical analysis workflow allows you to fine tune any analysis step at any time and assures full metrological traceability.



Key Features



Many different types of surface data can be loaded into
MountainsMap® Universal

Multiple imaging/metrology instrument compatibility

 Confocal microscopes
 Interferometric microscopes
 Scanning probe microscopes (STM, AFM, etc.)
 3D and 2D profilometers
 Structured light systems
 Form measuring systems
 Scanning electron microscopes*
 Hyperspectral spectrometers (Raman) *
 Other microscopes & surface imaging/metrology systems
 (* requires optional module)

High quality 3D surface imaging & stitching

 High quality real time imaging of 3D surface topography including surface flyovers (with movie output).
 Overlays - overlay 3D optical profiler color images and intensity images on 3D surface topography to speed up detection of surface features - overlay any multi-channel scanning probe microscope (SPM) image layer (phase, current, etc.) on SPM 3D surface topography to correlate different kinds of surface data.
 Full set of tools for removing and correcting artifacts prior to analysis including: correction and removal of anomalous scan lines, tip deconvolution, smoothing and denoising filters, thresholding and retouching.

Analysis of surface texture, geometry & form

 Full set of surface roughness/waviness filters including Gaussian (ISO 16610-21/61), cubic spline filter (ISO 16610-22/62), robust Gaussian filter (ISO 16610-31/71)
 Functional studies including bearing ratio curve, depth distribution histogram, surface substraction (wear) and more.
 Calculation of distances, angles, areas, volumes and step heights.
 Comparison with reference form (sphere, cylinder, plane or polynomial).

Overcome instrument limitations

 Increase field of view by automatically stitching together measured surfaces that overlap on the horizontal plane.
 Increase vertical range by manually patching together measured surfaces that overlap in the vertical axis.

Analyze sub-surfaces too

 Extract a sub-surface (for example a disk fixture ring, contact zone, MEMS layer or valley region) using ISO 25178 segmentation by watersheds algorithms or thresholding.
 Calculate parameters for the sub-surface only.

The most popular 2D and 3D surface texture parameters

 ISO 25178 3D height and functional bearing ratio parameters.
 ISO 4287 2D primary and roughness parameters.
 ASME B46.1 3D and 2D parameters.
 EUR 15178 amplitude and area & volume parameters
 DIN (Germany), JIS (Japan), GB/T (China), NF (France), BSI (UK), UNI (Italy), UNE (Spain) equivalents of ISO parameters.

Fast, automated, traceable surface analysis report creation

 Smart desktop publishing user environment in ten languages (EN, FR, DE, ES, IT, PL, PT-BR, CN, JP, KR)
 Hierarchical analysis workflow shows all analysis steps, facilitates fine-tuning and ensures full metrological traceability.
 Page viewer for fast navigation.
 Pass/fail criteria with green/red traffic lights can be specified for any parameter.
 Series of measurements can be analyzed automatically using templates and Minidocs (common sequences of analysis steps).
 Comprehensive data export: PDF and RTF multi-page documents, screen and print quality bitmaps for conference poster sessions, Excel-compatible numerical results for post-processing with 3rd party tools.


Sub-surface extraction and calculation of ISO 25178 height parameters and ISO 12781 flatness parameters for the sub-surface only.


Study of an anomaly on a MEMS contact.

Expandable & upgradeable

There is a wide range of optional modules for advanced and specialized applications. For example, carry out correlative studies by colocalizing 3D surface data obtained by 3D optical microscopes and profilers with images obtained by imaging microscopes.



Left: scanning electron microscope (SEM) image of nanowire. Right: colocalization of surface topography obtained by a scanning tunneling microscope (STM) with the SEM image using the Colocalization module (Images courtesy of IEMN, Lille, France.)

Optional modules

Colocalize and correlate 3D surface data obtained by confocal, interferometric and scanning probe microscopes and by profilometers with images obtained by SEM's and other imaging microscopes
 Colocalization module

Advanced studies, parameters & filters for areal surface analysis
 3D Advanced Surface Texture module

Advanced profile filtering, fractal and Fourier analysis, series of profiles
 2D Advanced Surface Texture module

Analyze grains, particles, islands, motifs, bumps, holes using multiple methods
 Grains & Particles module

Geometric dimensioning of contour profiles and horizontal contour extracted from images
 Contour Analysis module

Advanced dimensioning and tolerancing, DXF CAD compare, Gothic arch
 Advanced Contour Analysis module

Automated statistics for multiple data populations, process capability
 Statistics module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
 3D Fourier and Wavelets Analysis module

Analyze 4D surface evolution with respect to time, temperature, magnetic field, etc.
 4D Analysis module

SEM image enhancement and colored 3D intensity maps, reconstruction of 3D surfaces from 2 or 4 SEM images
 SEM Extension module

Read SPM file formats, work with multi-channel SPM images, correct data acquisition errors
 SPM Extension module

AFM force curve analysis, adhesion point detection, WLC models & statistics
 AFM Force Curves module

2D friction, core and lubrication zone analysis plus parameters for the automotive industry
 2D Automotive module

2nd generation lead analysis in accordance with the Daimler standard MBN 31 007-07
 Lead Analysis (Twist) module


Instrument compatibility


 MountainsMap® Universal inputs surface data in all instrument and generic file formats supported by Mountains Technology®. The range of supported file formats is subject to continuous evolution.
View the list of currently supported instruments and file formats
 Supported file formats