Analysis of atomic force microscope data for biferroic nanocomposite
(courtesy of ICMAB-CSIC).
MountainsMap® SPM software is compatible with all scanning probe microscopes including:
AFM 3D topography of a polymer (background image) and overlay of phase layer on the topography (foreground image).
MountainsMap® SPM software provides stupendous 3D nano surface visualization for scanning probe microscopes including:
Real time 3D imaging of SPM topography, phase, current and other layers.
Simultaneous manipulation of all layers (zoom, rotate, height amplification) and individual processing of single extracted layers.
Overlay any layer (phase, current, etc.) on 3D surface topography.
Image enhancement tools including:
MountainsMap® SPM software contains a full set of tools for correcting, normalizing and denoising scanning probe microscope data prior to analysis, including:
Automatic line-by-line correction and leveling (with option to ignore structures above and below the surface).
Thresholding with respect to height or material ratio.
Retouching to remove isolated artifacts.
Spatial filters with configurable matrices.
FFT plot editor (requires 3D Fourier & Wavelets optional module).
Application of line-by-line and least square leveling operators to a raw AFM image reveals the structure of peptides on atomic terraces. Images courtesy of IEMN, France.
Exfoliated graphene on Silicon Oxide atomic step height (courtesy LNE, French National Metrology Institute).
Surface roughness analysis of latex particles measured by AFM: calculation of height parameters and functional parameters.
MountainsMap® SPM software includes comprehensive analysis of surface texture and geometry:
Calculation of distances, angles, areas, volumes, step heights and coplanarity.
A full set of surface roughness/waviness filters including Gaussian (ISO 11562), cubic spline filter (ISO/TS 16610-22), robust Gaussian filter (ISO 16610 - 31).
Functional studies: bearing ratio curve, depth distribution histogram and more.
The most popular 2D profile and 3D surface texture parameters :
When a scanning probe microscope's field of view is too limited to measure the whole sample MountainsMap® SPM software provides:
Automatic stitching of multiple measurements into a single surface that is ready for analysis.
Topographical stitching of grid
MountainsMap® SPM's straightforward multi-language multi-page desktop publishing environment makes analyzing SPM, AFM, STM, etc. measurement data easy.
The smart user interface in MountainsMap® SPM software makes it easier than ever to analyze scanning probe microscope data:
Smart desktop publishing user environment in ten languages (EN, FR, DE, ES, IT, PL, BR-PT, CN, JP, KR).
Full screen mode for maximum comfort.
Hierarchical analysis workflow shows all analysis steps, facilitates fine-tuning and ensures full traceability of image processing.
Page viewer for fast navigation.
Pass/fail criteria can be specified for any parameter and green/red traffic lights are displayed automatically.
Series of measurements can be analyzed automatically using templates and Minidocs (common sequences of analysis steps) can be saved for insertion in future reports.
Excel-compatible numerical data export for postprocessing.
Image and document page export in standard bitmap formats and PDF and RTF analysis report export for easy publication and poster sessions.
MountainsMap® SPM has a wide range of optional modules for advanced and specialized applications.
For example the AFM Force Curves module provides AFM force curve analysis with automatic detection of adhesion points, wormlike chain (WLC) models for protein unfolding and statistics on series of force curves.
The Grains & Particles module includes multiple complementary methods for analyzing grains, particles and islands.
The Contour Analysis module is used to carry out geometric dimensioning of x,z and x,y profiles.
The Colocalization module makes it possible to combine SPM data and images from other microscopes, for example SEM's, to facilitate correlative studies.
In addition if you need to visualize and analyze data from a wider park of instruments then there is an upgrade path to MountainsMap® Universal and MountainsMap®, Premium.
AFM force curve analysis with WLC (wormlike chain) using the AFM Force Curves module
Grains analysis using the Grains & Particles module
AFM force curve analysis, adhesion point detection, WLC models & statistics
AFM Force Curves module
Advanced studies, parameters & filters for areal surface analysis
3D Advanced Surface Texture module
Analyze grains, particles, islands, motifs, bumps, holes using multiple methods
Grains & Particles module
Co-localize and correlate surfaces generated by your SPM with images from other instruments
Geometric dimensioning of contour profiles and horizontal contour extracted from images
Contour Analysis module
Advanced dimensioning and tolerancing
Advanced Contour Analysis module
Automated statistics for multiple data populations, process capability
FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
3D Fourier and Wavelets Analysis module
Analyze 4D surface evolution with respect to time, temperature, magnetic field, etc.
4D Analysis module
Advanced profile filtering, fractal and Fourier analysis, series of profiles
2D Advanced Surface Texture module