MountainsMap® SPM

Dedicated Scanning Probe Microscope imaging and analysis software for AFM, STM, MFM, SNOM, CSAFM, KPFM, etc.

Why choose MountainsMap® SPM software?

  • Compatible with all scanning probe microscope techniques for nano surface imaging and analysis.
  • Real time 3D multi-channel imaging of SPM topography, phase, defection, current, auxiliary and other layers including overlays.
  • High quality imaging with powerful image optimization and enhancement tools.
  • Intelligent SPM image artifact correction, scan line by line leveling, noise filtering.
  • Comprehensive nano surface analysis including nano-geometry and roughness.
  • Numerous optional modules including AFM force curve analysis and colocalization of SPM images with SEM and other images.
  • Smart user interface for maximum ease of use combined with powerful automation features - including multiple topography image stitching - to accelerate analysis.
  • Easy integration into research and lab environments including export of numerical data and images for easy post-processing and publication.

Analysis of atomic force microscope data for biferroic nanocomposite
(courtesy of ICMAB-CSIC).

Key features

Full scanning probe microscope compatibility

MountainsMap® SPM software is compatible with all scanning probe microscopes including:

  • Atomic force microscopes (AFM)
  • Kelvin probe force microscopes (KPFM)
  • Scanning tunneling microscopes (STM)
  • Current sensing AFM's (CSAFM)
  • Magnetic force microscopes (MFM)
  • Near-field scanning optical microscopes (NSOM)

AFM 3D topography of a polymer (background image) and overlay of phase layer on the topography (foreground image).

High quality 3D multi-channel SPM imaging and overlays

MountainsMap® SPM software provides stupendous 3D nano surface visualization for scanning probe microscopes including:

 Real time 3D imaging of SPM topography, phase, current and other layers.
 Simultaneous manipulation of all layers (zoom, rotate, height amplification) and individual processing of single extracted layers.
 Overlay any layer (phase, current, etc.) on 3D surface topography.
 Image enhancement tools including:

  • Wide range of renderings and glosses, user-definable color palettes.
  • Image brightness, contrast, gamma and saturation.
  • Selectable configurations for optimal lighting conditions.
  • Resampling to increase image resolution.
 Surface flyovers (with movie output).
 2D (x,z) profile extraction from all layers or any extracted layer.

SPM artifact correction, data normalization and denoising

MountainsMap® SPM software contains a full set of tools for correcting, normalizing and denoising scanning probe microscope data prior to analysis, including:

 Automatic line-by-line correction and leveling (with option to ignore structures above and below the surface).
 Tip deconvolution.
 Thresholding with respect to height or material ratio.
 Retouching to remove isolated artifacts.
 Surface subtraction.
 Spatial filters with configurable matrices.
 FFT plot editor (requires 3D Fourier & Wavelets optional module).

Application of line-by-line and least square leveling operators to a raw AFM image reveals the structure of peptides on atomic terraces. Images courtesy of IEMN, France.

Exfoliated graphene on Silicon Oxide atomic step height (courtesy LNE, French National Metrology Institute).

Surface roughness analysis of latex particles measured by AFM: calculation of height parameters and functional parameters.

Analysis of surface texure & geometry measured by SPM

MountainsMap® SPM software includes comprehensive analysis of surface texture and geometry:

 Calculation of distances, angles, areas, volumes, step heights and coplanarity.
 A full set of surface roughness/waviness filters including Gaussian (ISO 11562), cubic spline filter (ISO/TS 16610-22), robust Gaussian filter (ISO 16610 - 31).
 Functional studies: bearing ratio curve, depth distribution histogram and more.
 The most popular 2D profile and 3D surface texture parameters :

  • ISO 25178 3D height and functional parameters.
  • ISO 4287 2D primary and roughness parameters.
  • ASME B46.1 3D and 2D parameters.
  • EUR 15178 amplitude and area & volume parameters
  • GB/T (China), DIN (Germany), JIS (Japan, NF (France), BSI (UK), UNI (Italy), UNE (Spain) equivalents of ISO parameters.

Stitching of multiple SPM measurements

When a scanning probe microscope's field of view is too limited to measure the whole sample MountainsMap® SPM software provides:

 Automatic stitching of multiple measurements into a single surface that is ready for analysis.

Topographical stitching of grid  

MountainsMap® SPM's straightforward multi-language multi-page desktop publishing environment makes analyzing SPM, AFM, STM, etc. measurement data easy.

Fast, automated, traceable SPM surface analysis report creation

The smart user interface in MountainsMap® SPM software makes it easier than ever to analyze scanning probe microscope data:

 Smart desktop publishing user environment in ten languages (EN, FR, DE, ES, IT, PL, BR-PT, CN, JP, KR).
 Full screen mode for maximum comfort.
 Hierarchical analysis workflow shows all analysis steps, facilitates fine-tuning and ensures full traceability of image processing.
 Page viewer for fast navigation.
 Pass/fail criteria can be specified for any parameter and green/red traffic lights are displayed automatically.
 Series of measurements can be analyzed automatically using templates and Minidocs (common sequences of analysis steps) can be saved for insertion in future reports.
 Excel-compatible numerical data export for postprocessing.
 Image and document page export in standard bitmap formats and PDF and RTF analysis report export for easy publication and poster sessions.

Expandable & upgradeable SPM software

MountainsMap® SPM has a wide range of optional modules for advanced and specialized applications.
For example the AFM Force Curves module provides AFM force curve analysis with automatic detection of adhesion points, wormlike chain (WLC) models for protein unfolding and statistics on series of force curves.
The Grains & Particles module includes multiple complementary methods for analyzing grains, particles and islands.
The Contour Analysis module is used to carry out geometric dimensioning of x,z and x,y profiles.
The Colocalization module makes it possible to combine SPM data and images from other microscopes, for example SEM's, to facilitate correlative studies.
In addition if you need to visualize and analyze data from a wider park of instruments then there is an upgrade path to¬†MountainsMap® Universal and MountainsMap®, Premium.

AFM force curve analysis with WLC (wormlike chain) using the AFM Force Curves module

Grains analysis using the Grains & Particles module

Optional modules

AFM force curve analysis, adhesion point detection, WLC models & statistics
 AFM Force Curves module

Advanced studies, parameters & filters for areal surface analysis
 3D Advanced Surface Texture module

Analyze grains, particles, islands, motifs, bumps, holes using multiple methods
 Grains & Particles module

Co-localize and correlate surfaces generated by your SPM with images from other instruments
 Co-localization module

Geometric dimensioning of contour profiles and horizontal contour extracted from images
 Contour Analysis module

Advanced dimensioning and tolerancing
 Advanced Contour Analysis module

Automated statistics for multiple data populations, process capability
 Statistics module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
 3D Fourier and Wavelets Analysis module

Analyze 4D surface evolution with respect to time, temperature, magnetic field, etc.
 4D Analysis module

Advanced profile filtering, fractal and Fourier analysis, series of profiles
 2D Advanced Surface Texture module

SPM instrument compatibility

 Agilent Technologies
 Asylum Research
 Burleigh Instruments
 CSM Instruments
 Digital Instruments
 Image Metrology BCR-STM

 Molecular Imaging
 Nanotec Electronica (WSxM)
 Pacific Nanotech

 Park Scientific, PSIA
 Photonics Lattice
 SII Nanotechnology
 Surface Imaging Systems