MountainsMap® SPM
Dedicated imaging & analysis solution for scanning probe microscopes
For Atomic Force Microscopes (AFM) - Scanning Tunneling Microscopes (STM) - Scanning Near-field Optical Microscopes (SNOM) – etc.
ref: MNT6.S.SPM
MountainsMap® SPM is the best in class surface imaging and analysis solution for scanning probe microscopes of all kinds
- Entry level solution with a wide range of incremental optional modules for advanced applications.
- Analyzes multi-channel measurement data (topography, phase, deflection, etc.) in accordance with the latest standards and methods.
- Straightforward upgrade path to MountainsMap® Universal if you add a new type of instrument to your instrument park.
Real time high quality multi-channel imaging with overlays
- View 3D surface topography in 24-bit colors, manipulate it in real time, apply different renderings and palettes, make movies of surface flyovers, etc.
- Manipulate multi-channel images simultaneously and overlay any image (e.g. phase) on the 3D surface topography in order to study correlations.
- Clean up measurement data using powerful filters to remove anomalies, correct scan lines, minimize tip impact.
Basic analysis of surface texture and geometry
- Calculation of distances, angles, areas, volumes and step heights.
- 3D surface roughness analysis based on ISO 16610 advanced filtering techniques.
- Basic functional studies including bearing ratio curve, depth distribution histogram, surface subtraction and more.
The most popular 2D and 3D roughness parameters and more
- Calculate 3D height and bearing ratio parameters defined in the new ISO 25178 standard and EUR 15178 (Surfstand), ISO 4287 2D primary and roughness parameters, ASME B46.1 (USA), GB/T (Chine), DIN (Germany), JIS (Japan), BSI (UK), NF (France), UNE (Spain) and UNI (Italy) equivalents of ISO parameters.
Fast surface metrology report creation
- The highly intuitive desktop publishing environment (in seven European languages, Japanese, Mandarin Chinese and Korean) includes a page viewer for fast navigation, an analysis workflow for full metrological traceability and pass/fail traffic lights.
- Series of measurements can be analyzed automatically using templates and common sequences of analysis steps can be saved in a library for insertion in future reports.
- Data export (Excel .csv, text, bitmap, PDF).
MountainsMap® SPM optional modules
Force Spectroscopy
ref: MNT6.+.FORCE
- Analyze force curves and detect adhesion points automatically.
- Generate statistics on series of force curves.
- Generate a wormlike chain (WLC) model for protein unfolding.
3D Fourier Analysis
ref: MNT6.+.3DFFT
- FFT-based studies (e.g. of process-surface interactions) including frequency spectrum and power spectrum density.
- Filtering/denoising by edition of FFT plot.
4D Analysis
ref: MNT6.+.4D
- Visualize and analyze surface evolution with respect to time, temperature, magnetic field or another physical dimension.
- Generate statistics on selected parameters.
- Locate areas of preponderant change.
Grains & Particles
ref: MNT6.+.GRAINS
- Detect grains, particles and islands.
- Partition a surface into motifs (texture cells).
- Calculate ISO 25178 features parameters.
- Generate statistics.
3D Advanced Surface Texture
ref: MNT6.+.3DADVST
- Advanced studies of wear, lubrication, peak/grain distribution, isotropy, etc.
- Additional ISO 25178 3D parameters, ISO 12718 flatness parameters and more.
- Analysis of sub-surfaces.
- Execute MATLAB™ scripts to apply custom operators.
Stitching
ref: MNT6.+.STITCH
- Automatic stitching of overlapping measurements made on the horizontal plane.
2D Advanced Surface Texture
ref: MNT6.+.2DADVCONT
- Comprehensive 2D filtering techniques from 2RC to ISO 16610 with optional management of end-effects.
- Advanced roughness and functional studies.
- Execute MATLAB™ scripts to apply custom operators.
Contour Analysis
ref: MNT6.+.CONT
- Associate geometric elements with vertical (Z) and horizontal (XY) profiles.
- Calculate dimensions using auto-dimensioning and interactive tools.
Advanced Contour Analysis
ref: MNT6.+.ADVCONT
- Visualize and analyze form deviation of profiles (contours) from CAD models and user-defined nominal forms.
- Handle large positional tolerances.
Statistics
ref: MNT6.+.STATS
- Track and analyze results from multiple static or dynamic measurement populations.
- Generate Cpk parameters to monitor the repeatability of the production process.
Wavelets Analysis
ref: MNT6.+.WAVELETS
- Visualize and analyze scale levels and spatial locations where surface phenomena occur.
- Continuous wavelet decomposition (2D).
- Discrete wavelet filter (2D and 3D).
- Interactive selection of scale levels contained in roughness and waviness profiles and surfaces.
Image Co-Localization
ref: MNT6.+.IMAGECOLOC
- Automatically co-localize a simultaneous AFM topography image with one or more fluorescence images.
- Select laser wavelength for fluorescence images.
MountainsMap® SPM Compatibility
- Agilent Technologies 5x00 series
- Burleigh Instruments Vista
- CSM Instruments
- Digital Instruments Nanoscope
- Molecular Imaging PicoScan
- Nanosurf Nanite, EasyScan
- NT-MDT NTegra, Solver
- Omicron
- Pacific Nano. Nano-R AFM
- Park Systems XE series
- Quesant Q-Scope
- SII Nano. Nanopics, SPA-Series
- SIS Brucker
- Veeco Dimension, Nanoscope
- Support for new instruments