MountainsMap® SEM

Dedicated image enhancement, 3D reconstruction and metrology software
for scanning electron microscopes (SEM)

 30-day Free Trial

Mountains® SEM software brochure
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Product Information Sheet
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Why choose MountainsMap® SEM software?

  • SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks.
  • Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector.
  • 3D enhancement for single SEM images.
  • Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering.
  • SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising.
  • Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces.
  • Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178.
  • Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more.
  • Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.

3D reconstruction from 4 SEM images

SEM image colorization

3D reconstruction from 2 SEM images

Key Features

3D reconstruction of surface topography in 3 seconds plus surface metrology - 3D reconstruction from 2 SEM images of a periodic physical reference standard obtained at FEMTO-ST laboratory. Measurements of step heights and pitch confirm that the 3D reconstruction corresponds to reference standard dimensions

Superfast 3D reconstruction opens up a new dimension

 Reconstruct 3D surfaces (X, Y and Z in length units) in a matter of seconds from two SEM images obtained at different tilt angles, from a single anaglyph image, and from four images obtained using a 4 quadrant detector.
 Turn single gray scale SEM images into 3D enhanced color images, also in seconds.
 View 3D surface topography at any zoom level, angle and height amplification in real time.
 Colorize – automatic colorization using two selected colors – colored 3D intensity maps using configurable palettes.
 Enhance images and rendering - use optimized color palettes, select lighting conditions, remove anomalies, overlay semi-transparent SEM gray-level images on 3D colored topography, etc.
 Convert single SEM images into pseudo-3D intensity maps.
 Correct gray level drift – for example to remove variation in homogeneous phases.
 Extract 2D cross sections from 3D surfaces.

3D enhancement of a single SEM image. Example: structure on a ladybug. (SEM image: Chris Supranowitz, University of Rochester).

Gray level drift correction of a single BSE SEM image. Before correction there is variation in two homogeneous phases along the colored lines. Colorization highlights the variation. After drift correction each phase of the material is colored uniformly and a phase map is obtained. Metrics can be generated on surface composition, for example on the ratios between different phases. (SEM image courtesy of the School of Geosciences, University of Edinburgh.)

Surface geometry and form analysis

 Analyze lateral or topographical geometry – analyze dimensions of extracted profile contours and cross-sections – calculate distances, angles, areas, volumes and step heights.
 Compare reconstructed surfaces with nominal form (sphere, cylinder, plane or polynomial).
 Assess ISO form deviation (flatness, straightness, roundness).

Contour analysis of microfossil1

Surface texture analysis

 Analyze surface roughness and waviness – apply the latest ISO 16610 filtering techniques.
 Calculate 2D and 3D surface texture parameters - from Ra to ISO 25178 and ASME B46.1.
 Carry out functional studies - bearing ratio curve - depth distribution histogram - material/void ratios within a surface slice – wear volume assessment.
 Advanced parameters for specialized applications are available in optional modules if required.

3D reconstruction and surface analysis – separated form, waviness and roughness surfaces and ISO 25178 height parameters.

Correlative studies using colocalization

 Colocalize SEM images from different detectors - for example colocalize a secondary electron image with a backscattered electron image.
 Colocalize SEM images with images from other microscopes (light microscopes, AFMs, STMs, NSOMs, …)..
 Colocalize SEM images with surface topography obtained by scanning probe microscopes – overlay SEM images on SPM 3D surface topography (requires SPM Extension optional module).

AFM/SEM colocalization - zone extracted from AFM surface topography is colocalized with SEM BSE image - SEM image is overlaid on 3D topography (with adjustable transparency).2

Fast, automated, traceable analysis report creation

 Work in a smart user environment in your own language and generate multi-page analysis reports – comprehensive illustrated online help in 10 languages with examples.
 Trace analysis steps in the hierarchical analysis workflow and fine tune steps on the fly.
 Preview analysis document pages and navigate using the page viewer.
 Automatically analyze new image sets by applying existing documents as templates.
 Speed up analysis report creation using Minidocs – sequences of analysis steps saved as macros.
 Easy post-processing and publication using standard tools - Excel-compatible text export for all numerical data - high resolution image bitmap export up to 1200 dpi – Word-compatible and PDF document export.

Expandable & upgradeable

There is a wide range of optional modules for advanced and specialized applications. For example the Grains & Particles module includes multiple complementary methods for analyzing grains, particles, islands and surface morphology. The 4D Analysis module which can be used to denoise a series of SEM images using Principal Component Analysis.

Optional modules

Analyze grains, particles, islands, motifs, bumps, holes using multiple methods
 Grains & Particles module

Read AFM/SPM file formats, work with multi-channel SPM images, correct data acquisition errors
 SPM Extension module

Filter series of images, analyze 4D surface evolution
 4D Analysis module

Advanced studies, parameters & filters for roughness analysis
 3D Advanced Surface Texture module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
 3D Fourier and Wavelets Analysis module

Advanced dimensioning and tolerancing, DXF CAD compare
 Advanced Contour Analysis module

Automated statistics for multiple data populations, process capability
 Statistics module

Advanced profile filtering, fractal and Fourier analysis, series of profiles
 2D Advanced Surface Texture module

Increase field of view by automatically stitching together measured surfaces that overlap on the horizontal plane
 Surface Stitching module

Denoising a series of SEM images – using principle component analysis in the 4D Analysis module. Images courtesy of LNE (French National Metrology Institute).

 1 Microfossil image courtesy of Dr. Hannes Grobe, Hannover, Germany, licensed under the Creative Commons Attribution 3.0 Unported license.
 2 AFM-SEM colocalization and overlay images courtesy of LNE (French National Metrology Institute).