MountainsMap® Scanning Topography

Dedicated solution for scanning 3D surface profilometers

contact (stylus), non-contact (confocal chromatic, auto-focusing, laser triangulation, single point WLI)

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Product Information Sheet
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Why choose MountainsMap® Scanning Topography?


Best surface metrology solution
for contact & non-contact profilometers

MountainsMap® Scanning Topography provides real time 3D visualization and state of the art analysis of surface geometry and texture in accordance with the latest international standards and methods. It manages missing data points seamlessly and makes it possible to extract and analyze sub-surface layers in exactly the same way as full measured surfaces.

An extensive range of optional modules are available for advanced and specialist applications.




Key Features


Real time high quality 3D imaging

 High quality real time imaging of 3D surface topography, with a wide range of renderings and user-definable color palettes.
 Surface flyovers (with movie output).

 Full set of tools for correcting image artifacts:

  • Correction and removal of anomalous scan lines
  • Stylus tip deconvolution
  • Filtering of vibrations and spike removal
  • Thresholding and retouching
  • Resampling of the number of lines/point

Analysis of surface texture and geometry

 Full set of surface roughness/waviness filters including Gaussian (ISO 16610-61), cubic spline filter (ISO 16610-62), robust Gaussian filter (ISO 16610-71).
 Functional studies including bearing ratio curve, depth distribution histogram, surface subtraction and more.
 Calculation of distances, angles, areas, volumes and step heights.

Analyze sub-surfaces too

 Extract a sub-surface (for example a disk fixture ring, contact zone, MEMS layer or valley region).
 Calculate parameters for the sub-surface only.

Overcome instrument limitations

 Increase vertical range by manually patching together measured surfaces that overlap in the vertical axis.

The most popular 2D and 3D surface texture parameters

 ISO 25178 3D height and functional bearing ratio parameters.
 ISO 4287 2D primary and roughness parameters.
 ASME B46.1 3D and 2D parameters.
 EUR 15178 amplitude and area & volume parameters
 DIN (Germany), JIS (Japan), GB/T (China), NF (France), BSI (UK), UNI (Italy), UNE (Spain) equivalents of ISO parameters.

Fast, automated, traceable surface analysis report creation

 Smart desktop publishing user environment in ten languages (EN, FR, DE, ES, IT, PL, PT-BR, CN, JP, KR)
 Hierarchical analysis workflow shows all analysis steps, facilitates fine-tuning and ensures full metrological traceability.
 Page viewer for fast navigation.
 Pass/fail criteria with green/red traffic lights can be specified for any parameter.
 Series of measurements can be analyzed automatically using templates and Minidocs (common sequences of analysis steps).
 Comprehensive data export (Excel-compatible text files), bitmaps, PDF.


Two measurements of an LCD are patched together to form a complete surface.


New (left) and used (right) PVC analyzed by applying a template. The valley area is extracted by thresholding and the used PVC fails a roughness test.



A study of friction, core and entrapment zones using the 3D Advanced Surface Texture module

Optional modules

Advanced studies, parameters & filters for areal surface analysis
 3D Advanced Surface Texture module

FFT-based texture analysis, advanced FFT filtering
 3D Fourier module

Analyze grains, particles, islands, motifs, bumps, holes using multiple methods
 Grains & Particles module

Advanced profile filtering, fractal and Fourier analysis, series of profiles
 2D Advanced Surface Texture module

Geometric dimensioning of contour profiles and horizontal contour extracted from images
 Contour Analysis module

Advanced dimensioning and tolerancing, DXF CAD compare, Gothic arch
 Advanced Contour Analysis module

Automated statistics for multiple data populations, process capability
 Statistics module

Multi-scale analysis by wavelets
 Wavelets Analysis module

Analyze 4D surface evolution with respect to time, temperature, magnetic field, etc.
 4D Analysis module



Instrument compatibility


 Accretech
 Altimet
 Ambios
 Carl Zeiss
 Cyber Optics
 FRT
 Hommel-Etamic
 KLA Tencor
 Mahr
 Mitaka Kohki
 Nanofocus
 Nikon
 Optimet
 Rodenstock
 Scantron
 Solarius
 Somicronic
 STIL
 Tokyo Seimitsu
 Taylor Hobson
 UBM