MountainsMap® Example Applications

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Microcomponents – measuring surface roughness of lithium niobate ridges

SEM (scanning electron microscope) + MountainsMap SEM software


Researchers at the FEMTO-ST Institute in Besançon, France studied methods for fabricating lithium niobate ridges to be used for the development of programmable microcomponents.

Using a scanning electron microscope they imaged ridge sides then reconstructed a 3D model of the zone with MountainsMap® SEM software.

Surface roughness (Sa) was then calculated.

Input Data

  • SEM images
  • Mountains® tools used

  • Stereo reconstruction operator
  • ISO 25178 height parameters


  • 3D reconstruction of ridge surface and parameters including roughness (Sa)
    Data courtesy of R. Salut & M. Raschetti, Femto-ST


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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